Daily Archives: October 23, 2020

Non-local deformation sensing in nanoscale

AoS. Non-local deformation sensing in nanoscale

Nanoindentation and pico-indentation based on atomic force microscopy (AFM) are commonly used for the evaluation of material mechanical properties using the depth-loading profile measured at a specific location of the material. However, the interpretation of the measurement

Sustainable ZnSnO3 nanowires produced by a low-cost solution process

AoS. SEM image of ZnSnO3 nanowires.

Oxide materials, and more specifically, multicomponent oxide materials, have been widely explored in thin-film technology, being the indium-based materials very common. For example, conductive indium-tin oxide (ITO) or semiconductive indium-gallium-zinc oxide (IGZO) are key-materials in billion-dollar industries