Tag Archives: atomic force microscopy

Non-local deformation sensing in nanoscale

AoS. Non-local deformation sensing in nanoscale

Nanoindentation and pico-indentation based on atomic force microscopy (AFM) are commonly used for the evaluation of material mechanical properties using the depth-loading profile measured at a specific location of the material. However, the interpretation of the measurement

kINPen09 plasma treatment leads to antimicrobial effects against Candida albicans biofilms

Fluorescence microscopy of plasma-treated biofilms. AoS

Microbial communities are an increasing problem in medicine but also in industry. Thus, an efficient and rapid removal of biofilms from surfaces is becoming increasingly important. With the aid of the kINPen09, a radiofrequency plasma jet (RFPJ)

Domain strain-engineering for epitaxial ferroelectric thin films by sputtering

The integration of multiferroic materials in the new generation of nanostructured electronic devices requires precise and orderly control of the thin films growth, taking into account the nature of such materials to develop domain structures, that is,

Multi-scale mechanical characterization of prostate cancer cell lines

Cellular mechanics are of prime importance in the birth and the evolution of tumors towards increasingly aggressive stages and are often proposed as potential biomarkers to evaluate metastatic potential. Mechanical properties of two human prostate cell lines,

Building a matrix mediated cell expansion system for high-quality cartilage regeneration

Articular cartilage is a tissue found in joints throughout the body (knees, elbows, etc.) that plays a significant role in allowing the body to maintain proper movement and engage in physical activities; it also supports the transfer

The thinner, the glassier

Polymers are a key component of our technologies. The diversity of uses and forms of these inexpensive materials is impressive: polymers are present in almost all the aspect of everyday life. Polymers are also intensively studied at